-
Data: 2009-04-02 10:15:36
Temat: Re: Problem NTFS [Vista]
Od: " DZB" <d...@N...gazeta.pl> szukaj wiadomości tego autora
[ pokaż wszystkie nagłówki ]Nazgul <a...@o...pl> napisał(a):
> A co mówi SMART?
HMM SPORO TEGO JEST ale powiem szczerze że niebardzo jestem obeznany w
analizowaniu informacji SMART. Poniżej wklejam wszelkie info które wypluł
smartctl pod linuxem. Ostrzegam że długie ;)
--
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA MK8034GSX
Serial Number: 278AT0RXT
Firmware Version: AH301E
User Capacity: 80,026,361,856 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Thu Apr 2 12:07:58 2009 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 61) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always
- 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline
- 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always
- 1613
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always
- 1267
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always
- 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always
- 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline
- 0
9 Power_On_Hours 0x0032 087 087 000 Old_age Always
- 5593
10 Spin_Retry_Count 0x0033 125 100 030 Pre-fail Always
- 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always
- 1210
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always
- 26712
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always
- 52
193 Load_Cycle_Count 0x0032 096 096 000 Old_age Always
- 48531
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always
- 51 (Lifetime Min/Max 14/55)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always
- 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always
- 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline
- 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always
- 1
220 Disk_Shift 0x0002 100 100 000 Old_age Always
- 168
222 Loaded_Hours 0x0032 087 087 000 Old_age Always
- 5295
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always
- 0
224 Load_Friction 0x0022 100 100 000 Old_age Always
- 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always
- 412
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline
- 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 5372 hours (223 days + 20 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 cb fd b4 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00b4fdcb = 11861451
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 40 aa fb b4 e0 00 00:28:15.906 READ DMA
e7 00 00 00 00 00 a0 00 00:28:14.663 FLUSH CACHE
ca 00 08 d8 19 1f e0 00 00:28:14.663 WRITE DMA
ca 00 08 d0 19 1f e0 00 00:28:14.663 WRITE DMA
ca 00 08 e0 19 1f e0 00 00:28:14.662 WRITE DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 1245 -
# 2 Extended offline Interrupted (host reset) 70% 472 -
# 3 Short offline Completed without error 00% 472 -
# 4 Short offline Completed without error 00% 75 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
--
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