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eGospodarka.plGrupypl.misc.elektronikaKarty CF - ograniczona liczba cykli odczytu?Re: Karty CF - ograniczona liczba cykli odczytu?
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    Subject: Re: Karty CF - ograniczona liczba cykli odczytu?
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    Piotr "Curious" Slawinski pisze:
    > a mozna prosic zrodlo tej informacji i ew. jakich producentow (i jakich
    > pojemnosci) karty sa na to narazone?

    Jutro wypytam kolegę z działu "hardware" - na razie znalazłem krótki
    opis zjawiska:
    http://www.freshpatents.com/-dt20090205ptan200900343
    28.php?type=description

    cytat:
    During the read-out operation, the read voltage Vread is applied to
    control gates of the deselected cell transistors and the ground voltage
    is applied to a substrate (e.g., a bulk) of the deselected cell
    transistors. The drains of the deselected cell transistors are supplied
    with a predetermined voltage. The application of the read voltage Vread
    and the ground voltage causes a bias condition during the read-out
    operation.

    As illustrated in FIG. 3, the bias condition can cause electrons to be
    injected into a floating gate of the deselected cell transistor from the
    substrate during the read-out operation. The electrons can result in an
    unintentional programming (or soft programming) of a deselected cell
    transistor in on-state (or erased state), which is referred to as a
    'read disturbance'.

    A read disturbance may cause threshold voltages of the on-state (or
    erased state) memory cells to gradually increase. As noted by the shaded
    area shown in FIG. 4, threshold voltages of the on-state memory cells
    increase in proportion to number of read-out operations that are
    performed. The voltage increases may cause some of the on-state memory
    cells to be erroneously detected as off-cells, resulting in read fails.

    As the number of read-out operations performed increases, the
    probability of a read fail increases as shown in FIG. 5. If the number
    of bit errors exceeds a permissible range, a block corresponding thereto
    is treated as a bad block. The bad block containing the erroneous data
    is replaced by a reserved memory block, which is stored in the flash
    memory device. Here, the bad block is caused by a read disturbance, and
    not worn out by repetition of the programming or reading operation.
    Therefore, the bad block may be reused through erasure and replacement.

    Tekst pochodzi o opisu patentu na przeciwdziałanie zjawisku - więc
    możliwe że większość kart na rynku nie robi już takich numerów

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